经软X射线辐照的InP的表面损伤态  

The surface damage states of InP after soft X-ray irradiation

作　　者：刘昶时[1] 靳涛[2] 武光明[1] 杨祖慎[3] 

机构地区：[1]新疆石油学院,乌鲁木齐830000 [2]中国科学院新疆物理研究所,乌鲁木齐830011 [3]新疆大学,乌鲁木齐830046

出　　处：《核技术》1999年第3期139-142,共4页Nuclear Techniques

基　　金：国家自然科学基金

摘　　要：采用Ｘ光激发光电子能谱（ＸＰＳ）对经同步辐射软Ｘ光辐照的ＩｎＰ表面进行了分析。实验结果表明：ＩｎＰ表面辐照损伤与辐照Ｘ光的能量及剂量有关，尤其是具有近Ｐ原子Ｋ壳层共振吸收能量的软Ｘ光辐照与其它Ｘ射线辐照相比，其结果有所不同。文中就实验结果的机制进行了初步探讨。The surfaces of InP were investigated with XPS before and after irradiation by soft X-rays from a synchrotron radiation source.The experimental results indicate that the radiation damage on the surface of InP is related to the energy and dosage of the soft X-rays, particularly the radiation effect caused by X-rays with energies near the resonant absorption energy of K-shell for P atoms is different from that caused by other X-rays. A qualitative explanation for the results is given.

关 键 词：软X射线 辐照损伤 磷化钼 表面损伤态 

分 类 号：TN304.230[电子电信—物理电子学]