射频导纳在导电介质物位测量中的应用  

Application of radio frequency admittance in material level measuring of conductive medium

作　　者：路红娟[1] 

机构地区：[1]无锡工艺职业技术学院,无锡214206

出　　处：《信息技术》2010年第5期136-138,共3页Information Technology

摘　　要：电容式物位测量计测量导电介质时,测量的结果经常受到导电介质电极挂料的影响,分析了电极挂料产生的原因、挂料对测量结果的影响,提出了利用射频导纳技术解决挂料问题的工作原理,给出了射频导纳电容式物位测量系统的实施方案。When the capacitance level meter measures the conductive medium,the measured results are easily influenced by its probe attachment.This paper tries to analyze the forming causation of probe attachment and its effect on measured results,puts forward the method to resolve the problem of probe attachment by the RF admittance technology and gives out the feasible scheme of the RF admittance capacitance level measuring system.

关 键 词：射频导纳 物位测量 电容式物位计 挂料 

分 类 号：TH816[机械工程—仪器科学与技术]