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作 者:张东[1] 丁士华[1] 宋天秀[1] 杨秀玲[1]
机构地区:[1]西华大学材料科学与工程学院,四川成都610039
出 处:《压电与声光》2010年第3期467-470,共4页Piezoelectrics & Acoustooptics
基 金:四川省教育厅科技基金资助项目(2006C025);校人才基金资助项目(R0620109)
摘 要:采用固相反应制备了(Bi1.975Li0.025)(Zn2/3Nb4/3-xSnx)O7陶瓷,研究了Sn4+取代Nb5+对BLZNS陶瓷介电性能的影响。结果表明,当替代量x≤0.4时,相结构保持单一的单斜焦绿石相。介电损耗温度特性出现了明显的弛豫现象,运用缺陷偶极子模型分析了该现象。x为0.05、0.15、0.30和0.40时,样品的介电损耗峰值温度为78℃、7℃、36℃、83℃,比较了介电弛豫温区移动的差异及分析介电弛豫现象的不对称。(Bi1.975Li0.025)(Zn2/3Nb4/3-xSnx)O7 ceramics were prepared by the solid phase reaction method.The effects of Sn4+ substitution for Nb5+ on the dielectric properties of BLZNS ceramics were investigated.The results reveal that the ceramics have single monoclinic pyrochlore phase when the substitutive contents of x≤0.4.The relaxation behavior was observed clearly in the relationship of dielectric loss and temperature.The relaxation characteristic was analhyzed by the model of defect dipolar.When x increases from 0.05 to 0.15 and 0.30 then 0.40,the dielectric loss peak temperature of samples are 78 ℃,7 ℃,36 ℃ to 83 ℃,respectively.The difference of the shift in the tepmerature range of the dielectric relaxation and the asymmetry of dielectric relaxation were analyzed.
关 键 词:Bi2(Zn1/3Nb2/3)2O7系陶瓷 介电弛豫 介电性能 缺陷
分 类 号:TM28[一般工业技术—材料科学与工程]
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