三维插值的反向均匀化关键技术研究  

Key Technologies on Inverse Uniformity for Three Dimensional Interpolation

作　　者：李向伟[1] 

机构地区：[1]西安邮电学院,陕西西安710121

出　　处：《现代电子技术》2010年第12期125-128,共4页Modern Electronics Technique

基　　金：陕西省自然科学基金(2009JM8019)

摘　　要：针对由样本集直接建立的三维查找表数据不均匀,不能满足ICC Profile规范要求的问题,提出了反向均匀化的解决方法。重点讨论了反向均匀化过程中快速定位四面体、色域边界点外推技术以及色域边界外点的色域匹配等几个关键技术。根据LAB空间采样数据特点给出了一种快速定位四面体的算法,利用图像边界处理的外推思想得出了色域边界点插值模型,提高了插值的校正速度;讨论了色域匹配的裁剪匹配算法并提出了利用二维查找表来提高算法效率的思想,缩短了判断时间,降低了算法复杂度。最后通过实验验证了反向均匀化算法,给出了实验效果图。The inverse uniformity method is proposed to solve the problem that 3D look-up table created directly by color patch sample is usually not uniform, which can not meet the ICC Profile specification. Three key technologies are discussed in detail： fast searching tetrahedron, extrapolation of gamut boundary points and gamut mapping. A fast searching tetrahedron algorithm is given based on the characteristics of LAB spatial sampling data. The interpolation model of gamut boundary points is provided by extrapolation ideas of image boundary treatment ideas, the corrected speed of interpolation is improved. The matching cut algorithm of gamut mapping is studied, and the thinking of using two-dimensional look-up table to improve the efficiency of algorithm are stated, which shortened the time to determine and reduce the complexity of the algorithm. The inverse uniformity algorithm is verified by experiments, and its experimental results figures are given finally.

关 键 词：反向均匀化 三维插值 外推技术 色域匹配 

分 类 号：TP391[自动化与计算机技术—计算机应用技术]