嵌入式C编译器测试用例生成工具的设计  

Design of an Automatic Test Case Generator for Embedded C Compilers

作　　者：陈国梁[1] 郭东辉[1,2] 

机构地区：[1]厦门大学物理系,厦门361005 [2]厦门大学电子工程系,厦门361005

出　　处：《微计算机应用》2010年第6期37-43,共7页Microcomputer Applications

基　　金：福建省自然科学基金(2008J0220);厦门市科技计划项目(3502Z20093002)

摘　　要：首先提出了一种嵌入式编译器测试验证方法,即基于串口传输的变量值验证法,在此基础上设计了一款针对嵌入式C编译器测试的测试用例生成工具ECPAG。该工具根据嵌入式C语法,采用随机算法产生符合规则的任意语法组合,采用概率算法限定各语法要素的生成概率,成功地将基于深度优先搜索的有向图拓扑排序方法应用于函数随机调用中的递归问题的解决。工程应用表明:该自动化工具生成的测试用例集合能够较好地覆盖嵌入式C语法,达到75%以上的块测试覆盖率。The paper firstly proposes an approach to test and verify embedded C compilers, where the variables outputted from the tested program are sent back via serial port to verify the correctness of the compiler. And then an automatic test case generator for embedded C compiler which is named ECPAG （Embedded C Program Automatic Generator） is designed. The ECPAG uses a stochastic algorithm to randomly combine different syntax according to embedded C language syntax so as to generate test cases （in our context ： a program）, and utilizes a probabilistic algorithm to restrict the generation probability of each syntax. The generator also utilizes a depth - first search on the function call graph to avoid the appearance of recursive calls in random invocations. Practice evaluation shows that test cases generated by the automatic tool can cover syntax and semantics of embedded C language well, and a block - coverage in the excess of 75% is achieved.

关 键 词：嵌入式C编译器 测试用例生成 递归调用 

分 类 号：TP311.52[自动化与计算机技术—计算机软件与理论]