电阻阵列非均匀性测试  

Measurement of Resistor Array Non-uniformity

作　　者：苏德伦[1] 张金生[1] 廖守亿[1] 

机构地区：[1]第二炮兵工程学院精确制导与仿真实验室,陕西西安710025

出　　处：《红外技术》2010年第6期345-348,352,共5页Infrared Technology

基　　金：航空科学基金项目;编号:20080112005;中国博士后科学基金项目;编号:20080441274;某院重点平台建设项目;编号:WX07233

摘　　要：电阻阵列的非均匀性是一种固定模式的空间噪声,已成为影响红外图像质量的主要因素。根据电阻阵列的非均匀性信息,对其输入数据进行补偿是校正非均匀性的一种有效的方式。分析了校正算法对非均匀性测试的需求;提出基于成像探测的非均匀性测量手段;研究了图像退化对非均匀性测试的影响;根据测试中输入图像数据的特点,提出一种基于迭代测试的盲复原方法。仿真结果表明,基于迭代的复原方法能有效地从退化图像中复原电阻阵列的实际非均匀性图像,并取得较好的校正效果。The non-uniformity of resistor array is a kind of fixed pattern spatial noise. It has become a main impact on infrared image quality. An effective method is to compensate the input value based on the non-uniformity information to correct it. The algorithm for non-uniformity correction is investigated to acquire its demand for the measurement. A measurement method using imaging detector is presented and the influence of image degradation on the measurement is studied. According to the characteristics of the input image data using in the method, an iterative blind restoration measurement method is introduced. The results of the simulation indicate that the actual non-uniformity image can be restored from the blurred images and the method obtains an excellent correction effect.

关 键 词：电阻阵列 非均匀性校正 图像退化 非均匀性测试 

分 类 号：TN215[电子电信—物理电子学]