老化条件对OLED黑点缺陷的影响研究  

The Effect of Aging Time on the Dark Spot Defect

作　　者：李竑志[1] 唐利斌[1] 郑云[1] 李亚文[1] 季华夏[1] 姬荣斌[1] 

机构地区：[1]昆明物理研究所,云南昆明650223

出　　处：《红外技术》2010年第6期349-352,共4页Infrared Technology

基　　金：中国昆明光电子产业基地二期项目

摘　　要：有机电致发光(OLED)器件中工艺的缺陷导致了黑点的产生,通过环境加速老化能够加速黑点的生长,在一定的环境老化条件下观察了黑点的变化,总结出了黑点尺寸的变化与老化时间的函数关系,并用扩散理论进行了初步的解释。Dark spots in the light-emitting devices process defects were generated. The growth of dark spots has been accelerated durning environmental testing. Dark spots in the aging changes were observed under certain circumstances. The function of aging-time with dark spot size was abtained, the results were explained by diffusion theory.

关 键 词：OLED 黑点缺陷 环境老化 扩散模型 

分 类 号：TN103[电子电信—物理电子学]