碲铟汞晶体的透射电子显微分析  

TEM Analysis on Hg_3In_2Te_6 Crystal

作　　者：王新鹏[1] 孙晓燕[1] 介万奇[1] 罗林[1] 王涛[1] 傅莉[1] 

机构地区：[1]西北工业大学凝固技术国家重点实验室,西安710072

出　　处：《人工晶体学报》2010年第3期564-567,共4页Journal of Synthetic Crystals

基　　金：国家高技术研究发展计划(863)(No.2007AA03Z442)

摘　　要：采用垂直布里奇曼法,生长出直径为30mm的Hg3In2Te6晶体。通过透射电子显微镜观察Hg3In2Te6晶体和第二相粒子的形貌,并利用选区电子衍射技术分析其物相。结果表明:晶锭基体的物相为Hg0.5In0.33Te;同时观察到了HgTe、In2Te3等第二相,尺寸为10～40nm。推测晶体发生分解是形成第二相的原因。Hg3In2Te6 crystal with diameter of 30 mm had been grown by vertical Bridgman （VB） method.The second-phase particle in Hg3In2Te6 crystals had been investigated by transmission electron microscopy （TEM）.The selected area electron diffraction had been carried out with a view to analyze their phases.The experimental results show that the phase of ingot is Hg0.5In0.33Te.The phases HgTe and In2Te3 with the size 10-40 nm have been found in Hg3In2Te6 crystal,which is likely to be formed by the decomposition of Hg3In2Te6.

关 键 词：Hg3In2Te6 第二相 透射电子显微镜 选区电子衍射 

分 类 号：O78[理学—晶体学]