一种测量高强度直流X光机辐射能谱的方法  

A Method on Measuring the Energy Spectrum of X-ray Generator Bremsstrahlung

作　　者：罗剑辉[1] 王奎禄[1] 黑东炜[1] 周海生[1] 

机构地区：[1]西北核技术研究所,陕西西安710024

出　　处：《核电子学与探测技术》2010年第5期676-679,共4页Nuclear Electronics & Detection Technology

摘　　要：介绍了一种康普顿散射法测量高强度直流X射线能谱的方法,分析了X光机辐射谱与散射谱强度的关系表达式。在测量系统中使用能量分辨能力较好的高纯锗探测器,通过测量X光机照射低原子序数材料的散射能谱,再根据不同能量X射线在该散射立体角上的散射截面回推,从而获得X光机的辐射能谱。最后,给出了X光机的工作电压分别为15、80和100 kV时,散射法测量得到的钨靶X射线辐射谱。By the X-ray backscattering techniques, the method is described to measure energy spectrum of the high intensity continuous X-ray from X-ray generator, and establishes a intensity comparison expres- sion between the incident ray and backscatter ray. The scatter energy spectrum, when the generator op- erating voltage is 15, 80 and 100 kV, is measured by HPGe detector. Based on the scattering cross sec- tion of different energy X-ray, the energy spectrum of X-ray generator bremsstrahhmg is obtained.

关 键 词：X光机 散射法 能谱测量 

分 类 号：TL99[核科学技术—核技术及应用]