高速列并行10位模数转换电路的设计  

Design of High Speed Column-Parallel 10-Bit ADC

作　　者：高静[1] 姚素英[1] 徐江涛[1] 史再峰[1] 

机构地区：[1]天津大学电子信息工程学院,天津300072

出　　处：《天津大学学报》2010年第6期489-494,共6页Journal of Tianjin University(Science and Technology)

基　　金：国家自然科学青年基金资助项目(60806010);天津市科技支撑计划重点资助项目(09ZCGYGX01100)

摘　　要：设计了用于CMOS图像传感器列级信号处理系统的10位模数转换器.该模数转换电路采用两级转换的方式,转换速度较单斜ADC提高了近8倍.设计了电阻阵列式多路斜坡发生器、级联结构比较器、数字纠错和消失调等电路,该ADC在不增加工艺成本的条件下满足了10位精度的要求.电路采用Chartered 0.35μm工艺制造.测试结果表明,该模数转换器的INL<±0.5 LSB,DNL<±0.5 LSB,信噪比为58.364 7 dB.A novel column-parallel 10-bit ADC used in signal processing system of CMOS image sensor has been proposed in this paper, which has achieved the conversion speed almost 8 times higher than the single-slope ADC by adopting two-stage conversion structure. With the design of circuits including resistor-array ramp generator, cascade comparator, digital correction and offset cancellation, the ADC meets the requirement of 10-bit resolution without increase of processing cost. The proposed ADC was fabricated with Chartered 0.35 ktm technology and test results indicate that its INL〈± 0.5 LSB, DNL〈 ± 0.5 LSB and SNR is 58.364 7 dB.

关 键 词：模数转换器 电阻阵列 失调 比较器 

分 类 号：TN402[电子电信—微电子学与固体电子学]