基于.NET和COM+的分布式考试系统的设计与实现  

Design and realization of distributed test system based on .NET and COM+

作　　者：董久敏[1] 刘勇[1] 

机构地区：[1]烟台职业学院信息工程系,山东烟台264670

出　　处：《电子设计工程》2010年第7期82-84,87,共4页Electronic Design Engineering

摘　　要：针对现行考试系统安全性不稳定,读写访问速度慢,并行处理能力差,数据库服务器负担集中、过重,同一考场雷同题多等局限性,采用ASP.NET和COM+等新技术,将持久层封装在COM+组件中,将不同的数据访问分散到几个不同的数据库服务器中处理,通过COM+组件来访问分布式数据库,将耗费时间长但又不紧迫的写操作加入到COM+队列中,采用遗传算法组题。应用表明:分布式考试系统具有安全、稳定、高速处理数据的能力,试题雷同率为20%左右,同时克服了传统同类系统卡机、延时过长等缺点。The existing examination systems have some disadvantages such as unstable security, slow reading and writing access, poor parallel processing, overloaded database server, and too many similar test questions at same examination site. By using ASP.NET, COM＋, and other new technologies, this paper provided a solution to these problems. The key points included encapsulating persistence layer in the COM＋ components, dispatching different data accesses to several different database servers, accessing the distributed database servers through the COM＋ components, putting time-consuming but not urgent writing operation in COM＋ queue, and using the genetic algorithm to make test questions. Application shows that the distributed examination system has advantages such as high security, excellent stability, high-speed data processing capability, and low rate of similar test questions （about 20%）. It also overcomes existing examination systems＇ shortcomings such as crash, delay, etc.

关 键 词：NET架构 COM+ MTS 遗传算法 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术]