实现激光等离子体X射线诊断的椭圆弯晶谱仪研究  

Research on elliptical curved spectrograph for Laser plasma X-ray Diagnosis

作　　者：朱岗[1] 吴先哲 熊先才[3] 肖乐 

机构地区：[1]重庆理工大学重庆汽车学院,重庆400050 [2]重庆市科学技术研究院光学机械研究所,重庆401123 [3]重庆大学,重庆400044

出　　处：《激光杂志》2010年第3期52-53,共2页Laser Journal

基　　金：国家863-804课题资助项目（803-804-3）

摘　　要：按照布拉格衍射的基本原理,利用从一个焦点发出的光线经过椭圆面反射后汇聚于另一个焦点的特点,研制了双通道椭圆弯晶谱仪,分析出其测量的波长范围为0.2nm至2nm,布拉格角的覆盖范围是30°至67.5°。并阐明弯晶分析器的制作过程。在＂星光-Ⅱ＂激光装置上对分别使用LiF、PET、KAP和Mica四种弯晶分析器的双通道椭圆弯晶谱仪进行激光打靶实验,得到了铝、钛和金激光等离子体X射线的发射谱。According to principle of Bragg diffraction and the character that light emitted from one focus of ellipse will pass the other focus for elliptical surface reflection,a double-channel elliptically curved crystal spectrograph was developed.After structure of the curved crystal spectrograph is illustrated,it can be known that the range of wavelength is 0.2-2nm and the Bragg angle is from 30° to 67.5°.Then,the production process of the curved crystal analyzer is presented.Finally,X-ray diffraction experiments using double-channel ellipfically curved crystal spectrograph on Xingguang-Ⅱ＇ facility are specified in detail with one of the LiF、PET、KAP and Mica curved crystal analyzers.And the emission spectrum of Al.Ti and Au laser-plasma were obtained successfully.

关 键 词：激光等离子体 X射线光谱 弯晶谱仪 弯晶分析器 

分 类 号：TN744.15[电子电信—电路与系统]