半导体激光器电导数和光导数起伏现象与其可靠性的关系  

Relationship between fluctuation of electric derivative and optic derivative of laser diodes and its reliability

作　　者：张振国[1] 郭树旭[1] 张爽[1] 于思瑶[1] 

机构地区：[1]吉林大学集成光电子学国家重点联合实验室吉林大学实验区,电子科学与工程学院,长春130012

出　　处：《吉林大学学报（工学版）》2010年第4期1102-1105,共4页Journal of Jilin University:Engineering and Technology Edition

基　　金：国家自然科学基金项目(60471009);吉林省重大科技发展计划项目(200403001-4)

摘　　要：大量实验发现,可靠性差的半导体激光器其电导数和光导数曲线存在较大的起伏,但目前缺乏相关的理论分析,作者从理论上解释了电导数和光导数起伏与半导体激光器可靠性之间的关系。理论分析和老化实验均表明,电导数和光导数存在明显起伏的器件可靠性较差,电导数和光导数起伏可作为半导体激光器可靠性评价的有效方法。Many experiments have shown that laser diodes of poor quality often have the shortcoming of fluctuation in electric derivative curve and in optic derivative curve. The relationship between the fluctuation and the reliability of the laser diodes are discussed in this paper. Theoretical analysis and aging experiments show that if serious fluctuation occurs in electric derivative curve and in optic derivative curve,then the devices are unreliable. The electric derivative curve and optic derivative curve can be used as an indicator of the reliability of the laser diodes.

关 键 词：光电子学与激光技术 电导数 光导数 半导体激光器 可靠性 

分 类 号：TN248.4[电子电信—物理电子学]