电磁干扰下的电爆装置射频敏感频率研究  

Study on the RF Sensitive Frequency of Electro-Explosive Devices in EMI

作　　者：李贵兰[1] 李国新[1] 汪佩兰[1] 

机构地区：[1]北京理工大学爆炸科学与技术国家重点实验室,北京100081

出　　处：《北京理工大学学报》2010年第6期647-650,共4页Transactions of Beijing Institute of Technology

摘　　要：针对电爆装置在电磁辐射干扰下的射频敏感频率,提出采用场线耦合理论进行分析.建立了电爆装置的传输线模型,推导得到电爆装置吸收功率与入射频率之间的数学表达式,通过数值仿真的方法研究了敏感频率的影响因素.仿真结果表明,电爆装置的脚线长度决定敏感频率;脚线等长而连接方式不同的电爆装置射频敏感频率相同.研究结果可以为电爆装置的射频危害分析提供理论参考.The sensitive frequency of electro-explosive devices in EMI is analyzed based on field coupling to line theory. Firstly,the transmission line model of electro-explosive device is built up. Then,the formula of absorption power and incident frequency is given. The influence factors of sensitive frequency are drawn by means of numerical simulation. The simulation results showed that the sensitive frequency of electro-explosive device is decided by the length of its pin. Whether electro-explosive device with the same pin length is open or short,the sensitive frequency remained the same. These results are useful for RF hazard analysis of electro-explosive devices.

关 键 词：电磁干扰 电爆装置 敏感频率 场线耦合 

分 类 号：TM15[电气工程—电工理论与新技术]