Ho^(3+)掺杂硫卤玻璃陶瓷的中红外发光特性的研究  

Mid-Infrared Emission Properties of Ho^(3+) Ion in Nanocrystals Embedded Chalcohalide Glass Ceramics

作　　者：朱军[1] 戴世勋[1] 陈飞飞[1] 沈祥[1] 王训四[1] 徐铁峰[1] 聂秋华[1] 

机构地区：[1]宁波大学信息科学与工程学院,浙江宁波315211

出　　处：《光学学报》2010年第7期1916-1920,共5页Acta Optica Sinica

基　　金：国家自然科学基金(60878042;60978058);宁波市科技创新团队项目(2009B21007);宁波大学王宽诚幸福基金资助课题

摘　　要：在不同热处理工艺条件下制备了掺Ho3+(质量分数为0.6%)的65GeS2-25Ga2S3-10CsI(其各成份的摩尔分数为65%,25%,10%)硫卤玻璃陶瓷,测试了其密度、显微硬度、红外透射光谱、以及中红外荧光光谱,对比研究了基质玻璃与玻璃陶瓷样品之间性能差异。结果表明,随着热处理温度和时间的增加,玻璃陶瓷样品密度和显微硬度明显增加。样品的X射线衍射(XRD)和扫描电子显微镜(SEM)测试结果表明在440℃温度下热处理12 h的样品析出GeS2纳米颗粒尺寸为80 nm,Ho3+在玻璃陶瓷中产生在2.0μm和2.9μm两处中红外荧光明显增强。Glass ceramics based on mass fraction of 0.6% Ho3＋-doped 65GeS2-25Ga2S3-10CsI（in molar fraction） chalcohalide glass are prepared by various heat treatment technique.The densities,micro-hardness,infrared transmission and mid-infrared emission spectra of the samples are measured,and their differences between host glass and glass ceramic are investigated.The results show that the density and micro-hardness markedly increased after heat treatment and further increase with treating duration.X-ray diffraction（XRD） and scanning electron microscope（SEM） measurements indicate that GeS2 phase with grain size of 80 nm are precipitated after treating the host glass at 440 ℃ for 12 h,and the mid-infrared emissions of Ho3＋ ions of this glass ceramic sample at 2.0 μm and 2.9 μm are enhanced significantly.

关 键 词：光学材料 硫系玻璃 玻璃陶瓷 中红外发光 钬离子 

分 类 号：TQ171[化学工程—玻璃工业]