X荧光光谱法分析硅质-半硅质耐火材料的主次元素含量  

X-Ray Fluorescence Spectyometry Analysis of Main and Minor Element of Silica and Semi-Silica Refractories

作　　者：宋霞[1] 郭红丽[2] 胡坚[2] 

机构地区：[1]洛阳理工学院环境工程与化学系 [2]中钢集团洛阳耐火材料研究院,河南省洛阳市涧西区西苑路471023

出　　处：《光谱实验室》2010年第4期1565-1568,共4页Chinese Journal of Spectroscopy Laboratory

摘　　要：介绍了玻璃熔片XRF测定硅质-半硅质耐火材料中SiO2、Al2O3、Fe2O3、TiO2、CaO、MgO、K2O、Na2O等常见组分的定量分析。确定了该分析方法所适用的测定范围,并对标样的制备、试验条件的选择和分析结果做出了详细描述。The quantity analysis of SiO2,Al2O3,Fe2O3,TiO2,CaO,MgO,K2O and Na2O of silica and semi-silica refractories by XRF-fused cast bead method were introduced.The application scope of the method,selection of measurement condition,analysis result and produce process of the standard samples were described.The selection of measurement conditions,analysis of results and preparation of the standard samples in detail were determined and described.

关 键 词：玻璃熔片 X射线荧光光谱法 硅质-半硅质耐火材料 

分 类 号：O657.34[理学—分析化学]