导电微粒局部放电下SF_6分解组分色谱信号的曲线拟合分峰  

Separating Overlapped Chromatogram Signals of SF_6 Decomposed Products Under PD of Conductive Particles Based on Curve-Fitting

作　　者：张晓星[1] 姚尧[1] 唐炬[1] 任江波[1] 

机构地区：[1]重庆大学输配电装备及系统安全与新技术国家重点实验室,重庆400044

出　　处：《电工技术学报》2010年第7期179-185,共7页Transactions of China Electrotechnical Society

基　　金：国家重点基础研究发展计划资助项目(2009CB724506);重庆市科技攻关项目(CSTC;2007AC2041)

摘　　要：在采用气相色谱法对SF6分解产物组分进行分析时,由于其分解产物组分的色谱峰存在重叠情况,造成定量计算的困难。本文采用高斯函数和迭代曲线拟合的数值方法进行色谱峰分离,推导了曲线拟合迭代的公式,采取了由宽逐严的峰位确定方法,然后利用迭代公式对峰宽和峰强进行计算,确定最终的各峰峰强和峰宽,从而分离出重叠信号。通过对近完全重叠与部分重叠两种重叠情况的模拟、导电微粒(含金属突出物和自由导电微粒)模拟缺陷局部放电下的分析计算验证了算法的有效性,并可用于SF6分解产物与故障缺陷间相对含量对应关系定量分析的研究。The overlapped chromatogram signals of the SF6 decomposed products make it difficult to calculate the products contents, when analyzing its decomposed products by gas chromatograph method. This paper recommends a method to separate the overlapped chromatogram signals with curve-fitting and Gauss function. And it gives the derivation progress of the iterative formula. Meanwhile, it provides a method to confirm the peaks position, peaks intensity and width by iterative formula to separate the overlapped signals. By the simulation of almost completely overlapped signals and partly overlapped signals and the analysis of real chromatogram data under partial discharge （PD） of electrically conductive particles （including the metal protrusions and free metal partials）, it proves the validity of this method and can be used on the quantitative analysis study of the relationship between SF6 decomposed products and GIS failures.

关 键 词：SF6气体分解组分 重叠信号 气相色谱法 曲线拟合 GIS 

分 类 号：TM835[电气工程—高电压与绝缘技术]