一种有效的EEPLA的测试算法  

AN EFFECTIVE TESTING ALGORITHM FOR EEPLA

作　　者：张万鹏[1] 童家榕[1] 唐璞山[1] 

机构地区：[1]复旦大学电子工程系集成电路CAD研究室,上海200433

出　　处：《计算机应用与软件》1999年第2期31-34,61,共5页Computer Applications and Software

摘　　要：本文提出了一种硬件电路很少,故障覆盖率最高的EEPLA的测试算法。同其他测试算法相比,该方法可以对每一个交叉点进行编程控制。所有单一的或多重的交叉点故障、线电位固定在“1”(“0”)、桥连故障都可以测试到,且测试算法简单易行。A testing algorithm with small amount of extra hardware and complete fault coverage for EE-PLA is presented in this paper. In comparison to other testing algorithms, this method can be used to re-programme each crosspoint in EEPLA. All single and multiple crosspoint faults, stuck - at faults and bridging faults are detectable. The test algorithm is simple and easily practicable.

关 键 词：可编程逻辑阵列 测试算法 EEPLA 

分 类 号：TP332.1[自动化与计算机技术—计算机系统结构]