硅烷偶联剂KH-500对Ag掺杂SiO_2复合颗粒结构的影响  

Influence of silane coupling agent KH-550 on structure of sliver-silica composite grains

作　　者：邓仲勋[1] 李贵安[1] 焦飞[1] 张亚娟[1] 

机构地区：[1]陕西师范大学物理学与信息技术学院,陕西西安710062

出　　处：《陕西师范大学学报（自然科学版）》2010年第4期23-27,共5页Journal of Shaanxi Normal University：Natural Science Edition

基　　金：国家自然科学基金资助项目(60678005);陕西省自然科学基础研究计划资助项目(2006F39)

摘　　要：以硝酸银和正硅酸乙酯Tetraethyl orthosilicate(TEOS)为原料,乙醇为溶剂、甲醛为还原剂,KH-550为硅烷偶联剂,应用溶胶-凝胶法制备了不同结构的纳米银掺杂二氧化硅复合颗粒.分析了银掺杂二氧化硅复合颗粒的形成机理,并应用透射电子显微镜(Transmission ElectronMicroscope,TEM)、扫描电子显微镜(Scan Electron Microscope,SEM)、X射线衍射仪(X-rayDiffraction,XRD)及傅里叶变换红外光谱(Fourier TransformInfrared Spectrometer,FT-IR)等手段,对Ag/Si O2复合颗粒的结构进行了表征和分析.结果表明:实验制备的复合颗粒为球状,尺寸均匀,银颗粒在Si O2表面分布均匀,其粒径为3～8 nm;硅烷偶联剂KH-550会影响复合颗粒的结构,当KH-550量增加到0.5 mL后,复合颗粒发生明显团聚.The sliver-silica composite grains with different structures were prepared by sol-gel technology using silver nitrate and Tetraethyl orthosilicate（TEOS） as raw material,alcohol as solvent,formaldehyde as reducing agent and silane coupling agent KH-550 as modifying agent.the formation mechanism is analyzed,the structures of composite grains were characterized by Transmission Electron Microscope（TEM）,Scan Electron Microscope（SEM）,X-ray diffraction（XRD）and Fourier Transform Infrared Spectrometer（FT-IR）.The results indicated that the average size of composite grains was homogeneous and the shape was similar to sphericity,and the Ag grains（3～8 nm） were also well-distributed on the surface of silica.In addition,the structures of composite grains were affected by silane coupling agent KH-550 and the composite grains were agglomerated obviously as the volume of KH-550 up to 0.5 mL.

关 键 词：银 二氧化硅 硅烷偶联剂 纳米复合颗粒 

分 类 号：O433.4[机械工程—光学工程] TB383[理学—光学]