红外激光对可见光CCD成像系统的干扰  

Jamming of visible light array CCD imaging system by infrared laser

作　　者：刘长安[1,2] 陈金宝[1] 马金龙[2] 魏东[2] 孙滨[2] 裘伟[2] 罗向前[2] 周杰[2] 张轶[2] 

机构地区：[1]国防科学技术大学光电科学与工程学院,长沙410073 [2]西北核技术研究所,西安710024

出　　处：《强激光与粒子束》2010年第8期1727-1730,共4页High Power Laser and Particle Beams

基　　金：国家高技术发展计划项目

摘　　要：采用连续波红外激光对可见光面阵CCD成像系统进行了干扰实验,观察到饱和串扰、全屏饱和等干扰现象,并测到串扰阈值小于2.0×10^2W/cm^2,全屏饱和阈值为1.2×10^4W/cm^2。通过分析CCD输出电压、视频信号,提出基于有效干扰面积的干扰效果评估方法,并利用该方法对干扰面积与激光功率密度、辐照时间之间的关系进行了半定量分析。结果显示：激光功率密度对干扰效果的影响较大,而辐照时间在0.5～2.0 s之间时,辐照时间对CCD干扰效果的影响不明显。In the experiment,visible light array CCD imaging system was irradiated by continuous wave infrared laser.Crosstalk saturation and full-screen saturation were observed,and cross saturation threshold was less than 2.0×102 W/cm2,full-screen saturation was 1.2×104 W/cm2.An effective jamming area assessment method basing on the analysis of CCD＇s output voltage and video signal was presented.The relationship between jamming area and laser power density,the relationship between jamming area and irradiation times was studied respectively.It is concluded that radiation power density has a more important influence on jamming effect compare to radiation times when it＇s between 0.5 s to 2.0 s.

关 键 词：可见光面阵CCD 成像系统 红外激光 干扰 

分 类 号：TN249[电子电信—物理电子学]