X射线多重衍射效应  

Effect of X-ray Multiple Diffraction

作　　者：郝建民[1] 杨传铮[2] 

机构地区：[1]天津电子材料研究所,天津55信箱300192 [2]上海大学理学院物理系,上海201800

出　　处：《现代仪器使用与维修》1999年第2期5-8,共4页Modern Instruments

摘　　要：本文介绍了X射线多重衍射效应的起因,多重衍射图谱的指标化,给出了用普通X射线粉末衍射仪观测多重衍射效应的方法,并简要说明了多重衍射效应的应用。In this paper, the basic principle of x-ray multiple diffraction and the indexing process of multiple diffraction patterns were introduced. The method for observation of multiple diffraction by powder diffractometer was established. Some applications concerned with the effect of x-ray multiple diffraction were given shortly.

关 键 词：X射线衍射 多重衍射 X射线 衍射 

分 类 号：O436.1[机械工程—光学工程] O434.14[理学—光学]