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作 者:韩鹤友[1] 何治柯[1] 罗庆尧[1] 曾云鹗[1]
机构地区:[1]武汉大学化学系,武汉430072
出 处:《冶金分析》1999年第2期1-3,共3页Metallurgical Analysis
摘 要:基于丙酮在吐温40一氢氧化钾一过氧化氢一O_s(Ⅳ)体系中增强O_s(Ⅳ)的化学发光,采用流动注射进样技术,建立了测定痕量锇(Ⅳ)的新的化学发光分析法.方法的线性范围为1.0X1~-8~1.0X10~-6O(Ⅳ)/mL检出限为2.0X10~-9g/m,对10X10~-7g/mLOs(Ⅳ)标准溶液测定11次的相对标准偏差为3.0%.拟定方法用于贵金属精矿中痕量锇的测定,结果满意。本文还进行了增敏机理的探讨.A new chemiluminescent analysis for the determination of trace amount Os (VI) by flow--injection was proposed in this paper, based on acetone enhancing chemiluminescence of Os(VI) in Tween 40 - KOH -H_2O_2 - Os (VI ) chemiluminescent system. The detection limit is 2.0x10^-9g/mL, the linear range is 1.0x10^-8 1.0x 10^-6g/mL for Os(VI)and the relative standard deviation is 3.0% for 11 measurements of 1.0x 10^-7g/mL for Os(VI). The proposed method has been applied to the determination of Os(VI) in precious metal ores with satisfatory results. The mechanism of acetone enhancing was also investigated.
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