智能卡操作系统的测试技术  

Test Technology in Chip Operating System

作　　者：谢晶晶[1] 李代平[1] 郭琨[1] 

机构地区：[1]广东工业大学计算机学院,广东广州510006

出　　处：《计算机技术与发展》2010年第8期21-24,28,共5页Computer Technology and Development

基　　金：广东省广州市自然科技基金项目(2008-GX-015)

摘　　要：智能卡操作系统是智能卡能够支持复杂且安全的应用的基础,目前智能卡操作系统的测试并没有形成成熟的模式。为了在智能卡操作系统的开发中能够对操作系统进行全面并充分的测试,根据智能卡操作系统的体系结构特点、状态转移过程和通信方式,结合软件测试中的理论方法及测试技术,从基本功能、防拔插及耐久性三方面对智能卡操作系统的测试进行研究,给出了智能卡操作系统的测试方案。在EVDO卡的测试中表明,该测试方案是可行的。Chip operating system is basis of smart card capable of supporting complex and security applications.Now,the testing process of chip operating system has not been formed a mature mode.In order to develop chip operating system capable of operating in a comprehensively and fully tested.Based on the architecture of chip operating system features,state transition process and means of communication,combined with the theory of software testing methods and testing techniques,from basic features,anti-plug and durability of three aspects of testing a chip operating system research,present the test program of chip operating system.The feasibility of test scheme is proved by the testing in EVDO COS.

关 键 词：智能卡操作系统 测试用例 EVDO卡 

分 类 号：TP31[自动化与计算机技术—计算机软件与理论]