从47届丹佛X射线会议看X射线荧光分析的发展  

Development of XRF Analysis Viewed from\= the 47th Annual Denver Xray Conference

作　　者：茅祖兴[1] 

机构地区：[1]国家标准物质研究中心

出　　处：《岩矿测试》1999年第2期146-149,156,共5页Rock and Mineral Analysis

摘　　要：介绍了４７届丹佛Ｘ射线会议的简况。从会议的专题讲座和提交的学术论文可见，全反射Ｘ射线荧光、同步辐射、高能量分辨率超导检出器和聚毛细管光学透镜等新技术的引入。The paper briefly describes the 47th annual Denver Xray conference. From workshops arranged and academic reports presented to the conference, it is found that the introduction of many new advanced techniques, such as total reflection Xray fluorescence, synchrotron radiation, superconducting detectors with high energy resolution, polycapillary optics and so on, greatly pushes the development of trace and micro analysis forward.\=\=

关 键 词：X射线分析 痕量元素分析 微分析 丹佛会议 

分 类 号：O657.34[理学—分析化学]