基于PCIE的红外焦平面探测器测试系统  

TEST SYSTEM FOR INFRARED FOCAL PLANE DETECTORS BASED ON PCIE

作　　者：刘子骥[1] 蒋亚东[1] 祝红彬[1] 李伟[1] 

机构地区：[1]电子科技大学电子薄膜与集成器件国家重点实验室,四川成都610054

出　　处：《红外与毫米波学报》2010年第4期255-258,共4页Journal of Infrared and Millimeter Waves

基　　金：国家杰出青年基金项目(60425101)

摘　　要：介绍了一套自制高效的红外焦平面器件性能参数测试系统,建立了包括控制模块、辐射源、UFPA模块、信号采集模块和上位机程序在内的测试平台,分析了该系统平台的关键技术.系统可实现实时的数据采集,同时对RMS噪声、非均匀性、响应率、探测率、噪声等效功率和噪声等效温差等关键参数进行快速有效的计算分析,并能准确统计出盲元的数量和位置,分析、评估和存储器件每个像元的性能参数.A low-cost and efficient parameter test system for infrared focal plane arrays（IRFPA） was introduced. The test bench including control module, blackbody, UFPA module, signal acquisition module and the host computer program was established and the critical technologies of this system were analyzed. This system can realize real-time signal acquisition, and at the same time it can be used to analyze some important parameters, such as root mean square noise, nonuniformity, responsivity, detectivity, noise equivalent power （NEP） and noise equivalent temperature difference （NETD）, and so on. This system also can accurately determine the number and location of bad pixels, analyze, assess, and store the performance parameters of each good pixel of devices.

关 键 词：红外焦平面 测试系统 PCIE 

分 类 号：TN216[电子电信—物理电子学]