三因素及其交互作用对植物叶片多角度偏振高光谱特征的影响  

EFFECTS OF THREE INTERACTIVE FACTORS ON THE MULTI-ANGLE POLARIZED HYPERSPECTRUM OF VEGETATION LEAVES

作　　者：韩阳[1,2] 李潜[1,3] 赵云升[1] Wang Yeqiao 陈春林[1] 张莉莉[4] 

机构地区：[1]东北师范大学城市与环境科学学院,吉林长春130024 [2]罗得岛州大学自然资源科学系,美国金斯敦02881 [3]东北师范大学国家环境保护湿地生态与植被恢复重点实验室,吉林长春130024 [4]吉林省国土资源勘测规划研究院,吉林长春130061

出　　处：《红外与毫米波学报》2010年第4期316-320,共5页Journal of Infrared and Millimeter Waves

基　　金：国家自然科学基金(40771153);东北师范大学科技创新平台培育项目(106111065202);国家重点基础研究发展计划(973)项目(2009CB426305);中央高校基本科研业务费专项资金(09SSXT130)

摘　　要：在反射、散射和透射电磁辐射的过程中,植物叶片表面将产生与它们自身性质有关的偏振特征,完全可以作为遥感信息中有价值的信息来源.多角度对地观测能获得更为详细可靠的地面目标三维空间结构参数,使定量遥感成为可能.对植物叶片的多角度偏振高光谱探测成为定量遥感中的一种新手段.在分析植被叶片的多角度偏振高光谱特征基础之上,设计了一个3因素2水平的正交试验.通过对实验数据的方差分析发现,偏振角、入射天顶角、叶绿素以及三个因素之间的交互作用都可以对植物叶片的偏振反射产生影响,偏振角和入射天顶角对植物叶片的影响特别显著,二者的交互作用也有显著的影响.因此在今后的研究中,既要考虑单因素本身对植被叶片的偏振反射的影响,还要考虑到交互作用所起到的影响.Polarized features, which come from the surface of vegetation leaves in the process of reflectance, scattering and transmission of electromagnetic radiation, can be considered as the valuable information source in remote sensing information. The multi-angle earth observation can obtain more detailed and reliable 3-D spatial structure parameters of earth target, which makes the quantitative remote sensing possible. Multi-angle polarized hyperspectrum of vegetation leaves becomes new way for quantitative remote sensing detection. In this study, an orthogonal and two level test containing three factors was designed on the basis of analyzing the characteristics of multi-angle polarized spectrum of vegetation leaves. A- nalysis of data variance shows that polarized angle, incidence viewing azimuth, the chlorophyll and their interaction effects all have impacts on the polarized reflectance of leaves. The influences of polarized angle, incidence viewing azimuth and their interaction are particularly significant. Hence, not only some single factors but also their interaction effects should be considered in the future studies of vegetation leaves polarized reflectance.

关 键 词：多角度 偏振 高光谱 交互作用 

分 类 号：TP72[自动化与计算机技术—检测技术与自动化装置]