检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
出 处:《电子产品可靠性与环境试验》2010年第4期19-23,共5页Electronic Product Reliability and Environmental Testing
摘 要:在高可靠性、长寿命产品的可靠性分析中,当产品的失效为退化型失效时,利用产品的性能退化数据进行可靠性分析是一种更合理的方法。在考虑产品既存在平稳退化,又存在随机退化时,研究了产品退化失效的一般模型并给出了模型参数的估计方法。最后,利用所给的模型对强激光装置所用的某型金属化膜脉冲电容器进行了可靠性分析,并验证了该方法的可行性。For high-reliability products,it is difficult to assess the lifetime by using traditional reliability analysis methods since no enough failure data can be obtained in a given time.Wnen the degradation failure occurs,using the performance degradation data for the reliability assessment will be more effective than the traditional one.In this paper,a general degradation failure model and its parameters estimation method are presented considering both the steady and random degradations occurred.The methodology is demonstrated and validated in the reliability analysis of a metallized film pulse capacitors.
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.15