红外激光对可见光成像系统的硬损伤  

Infrared laser induced hard damage to visible light imaging system

作　　者：马金龙[1] 刘长安[1] 裘伟[1] 常星璋[1] 毛静锋[1] 白改朝[1] 刘玄贤[1] 罗向前[1] 魏东[1] 孙志伟[1] 涂遗[1] 

机构地区：[1]西北核技术研究所,西安710024

出　　处：《强激光与粒子束》2010年第9期2023-2026,共4页High Power Laser and Particle Beams

基　　金：国家高技术发展计划项目

摘　　要：采用波长为1315nm的连续波化学氧碘激光对某型摄像机进行了辐照实验,研究了可见光CCD成像系统在响应波段外红外激光辐照下的硬损伤效应。开展了光学系统变光圈尺寸下的激光辐照实验,发现当辐照水平一定的情况下,光圈尺寸越小,光学系统越难发生硬损伤,并解释了该现象的成因;测量到光圈尺寸最大、最小两种状态下的光学系统硬损伤功率阈值分别为几十W、几百W;得到CCD的激光损伤阈值为5.5×104W/cm2;结合相机输出的视频图像与显微镜拍到的被损感光器件实物照片分析了硬损伤机理。In order to research the hard damage effect on visible light CCD imaging system of off-band laser irradiation,one type of visible light imaging camera was irradiated by a continuous-wave chemical oxygen-iodine laser. Experiments with different camera aperture sizes were carried out. It was found that if aperture size became smaller,the hard damage would be more unlikely to happen,and the reason for this phenomenon was described. The hard damage threshold of the CCD was 5.5×104 W/cm2. Based on the CCD microscopic images,a preliminary discussion on the mechanism of hard damage was made.

关 键 词：红外激光 可见光成像系统 电荷耦合器件 光圈 硬损伤 阈值 

分 类 号：TN249[电子电信—物理电子学]