脉冲电流对纯Si凝固组织及性能的影响  

Effects of electric pulsed current on solidification and properties of pure Si

作　　者：张春祥[1] 王强[1] 张新宇[1] 张龙[1] 常国伟[2] 王建中[2] 刘日平[1] 

机构地区：[1]燕山大学亚稳材料制备技术与科学国家重点实验室,河北秦皇岛066004 [2]辽宁工业大学材料科学与工程学院,辽宁锦州121001

出　　处：《燕山大学学报》2010年第4期318-322,共5页Journal of Yanshan University

基　　金：国家自然科学基金资助项目(50771090)

摘　　要：用频率为3Hz、6Hz、10Hz脉冲电流处理了纯Si熔体试样。用金相显微镜、原子力显微镜对试样进行观察,可以看出经过脉冲电流处理后的纯Si,组织及晶粒粗大化,晶界也变的越来越不明显;利用扫描电子显微镜观察试样断口形貌,经脉冲电流处理后使纯Si的脆性增强;由测得的试样的电阻率,表明经脉冲电流处理试样的电阻率比未经脉冲电流处理的试样电阻率显著降低,并且随着脉冲电流频率的增大,电阻率不断减小。The melts of pure silicon are processed by pulsed electric current at the frequency of 3 Hz, 6 Hz and 10 Hz, respectively, and the effect on the solidification and properties of pure silicon is investigated. It can be found that the size of crystal grains exposed to pulsed current became larger and the grain boundaries became blurry and sample became more fragile. The electrical resistivity is also measured. It is shown that the electrical resistivity decreased notablely after process and the electrical resistivity reduced gradually with increasing the frequecy of pulsed electric current.

关 键 词：脉冲电流 SI 凝固 

分 类 号：TG111.4[金属学及工艺—物理冶金]