扩展D-矩阵分割在测试序列生成中的应用  

Applications of Extended D-matrix Splitting in Test Sequence

作　　者：朱明初[1] 刘松风[2] 林志文[3] 

机构地区：[1]海军工程大学电子工程学院,湖北武汉430033 [2]海军装备技术研究所,北京102442 [3]清华大学自动化系,北京100084

出　　处：《计算机测量与控制》2010年第8期1712-1714,共3页Computer Measurement &Control

基　　金：海军装备部装备保障重点项目

摘　　要：D-矩阵是系统装备测试与诊断的基础,为克服一般D-矩阵信息的不足,提出了一种扩展的D-矩阵,较好的反映了装备的属性,解决了D-矩阵功能故障定义中信号失效易混淆的问题;在扩展D-矩阵的测试序列生成过程中,提出了矩阵分割应用于测试序列优化的方法,用例表明该方法可显著降低计算复杂度,且提高故障隔离的指向性,避免各类测试交叉进行的情况。D - matrix is the basement of system equipment test and diagnosis. In order to cover the shortage of general D- matrix information, extended D - matrix is explored, reflecting the nature of Equipment and solving the problem that could cause confusion in signal invalidation of D- matrix functional failure definition. During the formation of extended D-matrix test sequence, matrix splitting is stated to be applied in the method of test sequencing with cases that the method could reduce computational complexity and bring directivity of fault isolation and avoid crossover in various tests.

关 键 词：D-矩阵 扩展D-矩阵 测试序列 矩阵分割 

分 类 号：TP206.1[自动化与计算机技术—检测技术与自动化装置]