低损耗薄膜背散仪的结构优化  

Structural optimization of the low-loss instrument for measuring film backscattering

作　　者：汪桂霞[1] 王青松[2] 徐昌杰[2] 

机构地区：[1]西安工业大学北方信息工程学院,陕西西安710032 [2]西安工业大学光电工程学院,陕西西安710032

出　　处：《光学仪器》2010年第4期71-74,共4页Optical Instruments

摘　　要：在低损耗薄膜背散仪的原理基础上,提出了一套使能量损耗最少的结构优化方法。在原始装置的基础上,通过加一λ/2波片和用一个齿轮传动装置,以及把λ/4波片和检偏器换成λ/2波片这三个改进装置,来消除测试仪旋转及实现s、p偏振态测量时引起的能量损耗,保证了入射到被检测表面时的能量最大。A set of minimum energy loss to the structure optimization is proposed based on the principle of the low-loss instrument for measuring film backscattering. It＇s in the foundation of the original device, eliminate the energyrs wastage that is aroused by the circumgyration of the instrument and the measure of the state of ＇s＇ or ＇p＇ polarization through the devices of adding a λ/2 wave plate, using a gear transmission and taking the λ/4 wave plate and analyzer to be λ/2 wave plate. Then the energy of incidence the measured surface will be the most.

关 键 词：背散射 波片 齿轮传动 能量损耗 

分 类 号：O432[机械工程—光学工程]