薄膜材料折射率色散的进展与展望  

Development and prospect of refractive-index dispersion of thin films

作　　者：叶帆[1] 顾兵[1] 黄晓琴[1] 

机构地区：[1]南京师范大学物理科学与技术学院,江苏南京210046

出　　处：《光学仪器》2010年第4期90-94,共5页Optical Instruments

基　　金：国家自然科学基金资助项目(10704042)

摘　　要：薄膜材料在现代科技中应用广泛,其折射率是光学薄膜设计中的重要参量。首先简要介绍了折射率色散基本理论,其后着重分析了Cauchy色散公式、Sellmeier公式、改进型Sellmeier公式和Wemple-DiDomenico单振子色散模型等几种典型的折射率色散理论,重点阐述了各种色散理论的基本原理、特点和适用条件,同时结合薄膜材料的发展探讨了折射率色散理论的发展趋势。Thin films are widely used in modern science and technology, and the refractive index play an important role in designing optical thin films. In this paper, the basic theory of the refractive index dispersion is introduced in brief. We focus our attention to analysis several typical refractive-index dispersion models, including Cauchy dispersion formula, Sellmeier formula, improved Sellmeier formula, and Wemple DiDomenico single-oscillator model. We also discuss the basic principles, characteristics, and application conditions of the above- mentioned dispersion theories. Furthermore, considering the development of novel thin films, we discuss the tendency of the refractive index dispersion theory.

关 键 词：薄膜材料 折射率 色散模型 

分 类 号：O436.3[机械工程—光学工程]