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作 者:朱敏[1] 黄羽[2] 全亚民[1] 罗积润[1] 郭炜[1] 黄云平[1] 张燕生[1] 崔惠兵[1]
机构地区:[1]中国科学院电子学研究所中国科学院高功率微波源与技术重点实验室,北京100190 [2]哈尔滨工业大学,哈尔滨150000
出 处:《真空科学与技术学报》2010年第5期551-556,共6页Chinese Journal of Vacuum Science and Technology
基 金:国家自然科学基金资助项目(No.10775139;60971073)
摘 要:讨论了三间隙耦合腔输出结构中各模式的谐振频率特性,分析了耦合系数对模式重叠过程的影响。以X波段为例,模拟计算了输出结构的群时延特性,研究了输出结构工作的稳定性。结果表明,在带内波动约1.7 dB的条件下,采用三模重叠,可获得6.61%的瞬时带宽,具有良好的稳定性。The resonance characteristics of the three-gap coupled cavity output structure with three-mode overlapping were experimentally and analytically studied. The influence of the coupling coefficient on the mode of overlapping was analyzed. Taking X-band three-gap coupled cavity output structure as an example, we simulated the group delay characteristics and the working stability. The simulated results show that the output bandwidth of 5.51% with a fluctuation about 1.7 dB in X-band can be achieved with the three-mode overlapping, and that each mode works with fairly high stability in the bandwidth. The results may also be of much interest in improving the properties of klystrons, such as its output power, its frequency, and its bandwidth.
关 键 词:模式重叠 三间隙耦合腔输出结构 耦合系数 电子负载电导 稳定性
分 类 号:TN122.5[电子电信—物理电子学]
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