硅太阳能电池纹理缺陷检测  

Texture defect inspection for silicon solar cell

作　　者：张舞杰[1] 李迪[2] 叶峰[2] 

机构地区：[1]华南理工大学自动化科学与工程学院,广州510641 [2]华南理工大学机械与汽车工程学院,广州510641

出　　处：《计算机应用》2010年第10期2702-2704,2708,共4页journal of Computer Applications

基　　金：中国博士后基金资助项目(20070420784);广东省工业攻关资助项目(2008B01040004)

摘　　要：为实现硅太阳能电池纹理缺陷检测,提出一种采用方向可变滤波器组并结合Hough变换的检测方法。通过方向可变滤波器提取图像边缘并采用Hough变换确定纹理方向,采用角度与纹理方向一致的方向可变滤波器滤波,实现消除规则直线纹理,保留纹理缺陷特征。对滤波后的纹理缺陷结果图像采用双阈值法,以确定纹理缺陷所在的位置。和Gabor滤波器及小波滤波器的比较实验结果表明:该方法比前两种方法能更有效地进行硅太阳能电池纹理缺陷检测。In order to detect texture defects of silicon solar cells, a texture defect detection method combining the steerable filters with Hough transform was proposed. After image edges were extracted by using the steerable filters, the direction of texture was determined through Hough transform. The steerable filters as the same angle as that of texture direction was adopted to filter texture image of silicon solar cell, which could eliminate the line-like textures and retain the characteristics of texture defects. Locations of texture defects were determined in the filtered image with texture defects by using the dual threshold method. Compared with Gabor filter and wavelet filter methods, the experimental results show that the steerable filter method can be more effective for detecting texture defects than Gabor filter and wavelet filter methods.

关 键 词：硅太阳能电池 方向可变滤波器 纹理缺陷 缺陷检测 HOUGH变换 

分 类 号：TP394.1[自动化与计算机技术—计算机应用技术]