经导管室间隔缺损封堵术后房室传导阻滞的危险因素  

Risk factors of artrioventricular block after transcatheter closure of ventricular septal defects

作　　者：陈阳[1] 徐仲英[1] 

机构地区：[1]北京协和医学院中国医学科学院阜外心血管病医院心血管病研究所放射科,北京100037

出　　处：《中国介入影像与治疗学》2010年第5期579-582,共4页Chinese Journal of Interventional Imaging and Therapy

摘　　要：室间隔缺损是常见的先天性心脏病。自应用Amplatzer偏心型膜周部室间隔缺损封堵器治疗室间隔缺损以来,随着封堵器的改进与国产化,经导管室间隔缺损封堵术已在临床广泛开展,房室传导阻滞因其对心功能及远期预后的影响日益受到关注。本文对经导管室间隔缺损封堵术后发生房室传导阻滞的各种危险因素进行综述。Ventricular septal defect（VSD）is one of the most common congenital cardiac malformations.Since the Amplatzer membranous VSD occluder in treatment of VSD developed,with advances in transcatheter treatment options,percutaneous device closure of VSD has become a safe and practical alternative for surgical repair.The initial clinical experience of using this method has been very encouraging with results showing a high rate of complete closure and a low incidence of complications at mid-term follow-up.However,closure device of perimembranous VSD may resulted in complete artrioventricular block.In this article,the risk factors and preventive measures of artrioventricular block after percutaneous device closure of VSD were reviewed.

关 键 词：室间隔缺损 心脏传导阻滞 封堵器 危险因素 

分 类 号：R541.1[医药卫生—心血管疾病]