浅议μ介子断层扫描技术  

Review of Muon Tomography

作　　者：冯寒亮[1] 焦晓静[1] 

机构地区：[1]西北核技术研究所,西安710024

出　　处：《核电子学与探测技术》2010年第8期1092-1097,共6页Nuclear Electronics & Detection Technology

摘　　要：μ介子断层扫描技术是一种新兴的探测成像技术,具备三维成像、零放射性污染、成本低、检测速度快、应用范围广等优点,尤其是在核材料探测领域的应用价值较高。阐述了μ介子断层扫描技术原理和优势,重点介绍了美国决策科学公司与洛斯.阿拉莫斯国家实验室研制的μ介子断层扫描系统。As a new detection technology, Muon tomography has some potential benefits, such as being able to form a three - dimensional image, without radiation, low cost, fast detecting, etc.. Especially, Muon tomography will play an important role in detecting nuclear materials. It introduces the theory of Muon tomography, its advantages and the Muon tomography system developed by Decision Sciences Corporation and Los Alamos National Laboratory.

关 键 词：Μ介子 MT系统 核材料 探测 

分 类 号：TL816.9[核科学技术—核技术及应用]