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机构地区:[1]上海大学机电工程与自动化学院自动化系上海市电站自动化技术重点实验室,上海200072 [2]河南汉威电子股份有限公司,河南郑州450000
出 处:《传感器与微系统》2010年第9期91-93,共3页Transducer and Microsystem Technologies
基 金:上海市科技计划资助项目(08DZ2272400);国家自然科学基金资助项目(60975079);上海市科研计划资助项目(A10-0109-07-005)
摘 要:设计了一种红外探测器元件性能评估系统,包括黑体,斩波器,单片机控制电路,信号调理电路,高精度数据采集卡,CVI虚拟仪器软件,能够测试红外探测器在特定频率红外照射下的灵敏度和无红外照射下的噪声幅度。噪声的测试采用一次样本采集,快速傅立叶变换分析,得出各个频率的噪声幅度。该系统自动读取计算机系统配置,完成参数初始化,具有操作简单方便、界面友好、测试效率高、可扩展性强、成本低和可靠性高的优点。经过实际测试实验,该系统可方便有效地测试红外探测器性能,实验结果的精度和速度均高于常规方法。An evaluating system for infrared detector elements is designed. It includes a blackbody, a chopper, a single chip microcomputer, a high-precision data acquiring card and the CVI virtual instrument software. The sensitivity of infrared detectors is tested in the condition of specific frequency infrared light irradiation. The noise is tested in non-infrared irradiation. Noise tests are conducted using a sample collection and noise amplitude of various frequency are obtained through the FFT analysis. The system automatically readout the eonfiguration of the computer system to complete the initialization of most parameters. It has many advantages such as simple operation,user-friendly interface, high efficiency test, strong scalability, low cost, high reliability etc. The test experimental result shows that the system could conveniently and effectively test the characteristics of infrared detectors. The precision and speed of experimental results are better than conventional methods.
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