测量纳米材料电阻率和磁阻的两种高精度方法  

Two High Precision Methods of Measuring the Electrical Resistivity and Magnetoresistivity of Nanocrystalline Materials

作　　者：陈杭德[1] 施耀铭[1] 何正明[1] 

机构地区：[1]上海大学理学院物理系

出　　处：《上海大学学报（自然科学版）》1999年第2期181-183,共3页Journal of Shanghai University:Natural Science Edition

摘　　要：研究纳米材料内部结构和电阻输运机制需要有高精度的仪器来测量纳米材料的电阻率和磁阻．凯尔文直流双臂电桥和直流电位差计具有灵敏度高、读数精确和使用方便的特点，尤其是直流电位差计在使用时不影响被测对象的原来的状态，是精确测定纳米材料电阻率和磁阻的有效工具．High precision instruments of measuring electrical resistivity and magnetoresistivity are needed to study the inner structure and resistance characteristic of nanocrystalline materials. When applied, Kelvin bridge and potentiometer have the virtues of high sensitivity, precision reading and convenience to use, especially potentiometer does not affect the original state of the samples being detected at all. Both of them are effective tools to measure the electrical resistivity and magnetoresistivity precisely. Their principles and methods of measurement as well as some problems worthy of note in practice are introduced here.

关 键 词：纳米材料 电阻率 磁阻 测量 直流电位差计 精度 

分 类 号：O48[理学—固体物理] TB39[理学—物理]