光束质量对哈特曼波前探测精度影响的仿真分析  

Simulation analysis of influence of beam quality on Hartmann wavefront detection accuracy

作　　者：孙绎成[1] 李晓峰[2] 黄健[2] 

机构地区：[1]电子科技大学电子工程学院,成都610054 [2]电子科技大学空天科学技术研究院,成都610054

出　　处：《光通信技术》2010年第10期57-59,共3页Optical Communication Technology

基　　金：国家自然科学基金(NSFC60978050)支助

摘　　要：哈特曼波前探测器通过探测子孔径光斑质心误差来复原重构被测光束的波前,所以它的测量误差不仅受其自身的结构参数影响,也受被测量光束的光学特征影响。仿真分析表明:当被测光束的波前具有比较多的高阶成分或者哈特曼的微透镜阵列装调不精确时,被测光束强度分布不均匀将会严重影响哈特曼的波前探测误差。The Hartmann wavefront senor reconstructs the wavefront of the measuring beam by detecting the centroid error of the spot on every subaperture. Therefore the wavefront measurement error is not only affects by its structure parameters, but also affects by the optical characteristics of the measuring beam. The numerical simulation results shows that the non-uniform intensity distribution would seriously affect the wavefront measurement error on condition that the wavefront of the measuring beam has much higher frequency components and the mircrolens array of the Hartmann is not assembled precisely.

关 键 词：哈特曼波前传感器 光束质量 波前探测 

分 类 号：TN929.1[电子电信—通信与信息系统]