短距离测试场的远场波瓣修正  

Far Field Pattern Correction for the Short Distance Range

作　　者：李浚沛[1] 刘俊群[1] 

机构地区：[1]南京电子技术研究所天线与微波技术重点实验室

出　　处：《微波学报》1999年第2期121-126,共6页Journal of Microwaves

摘　　要：天线测量距离一般用２Ｄ２／λ，此时天线边缘处存在２２．５°的相差。但是极低副瓣天线要求测量距离为２Ｄ２／λ的几倍，现有场地无法满足这个条件。本文提供的新方案，可把菲涅尔区方向图经修正变换为远区方向图。仅以圆口径天线为例。Usually the selected antenna measurement distances is 2D 2/λ .Then the antenna rim will produce a phase error of 22.5°.It is necessary to select a distance of several multiples of 2D 2/λ for the measurement of Ultra Low Sidelobe Antenna.The present antenna range cannot satisfy this condition.The new method which transforms a Fresnel region pattern into a far field pattern by correction is presented.This paper describes only the correction method used in the circular antenna aperture.

关 键 词：菲涅尔区 远区 场变换 修正 天线 

分 类 号：TN820[电子电信—信息与通信工程]