Effect of Dopant Properties on the Microstructures and Electrical Characteristics of Poly(3-Hexylthiophene) Thin Films  

Effect of Dopant Properties on the Microstructures and Electrical Characteristics of Poly(3-Hexylthiophene) Thin Films

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作  者:马良 

机构地区:[1]Department of Chemistry and Chemical Engineering, Minjiang University, Fuzhou 350108

出  处:《Chinese Physics Letters》2010年第11期162-165,共4页中国物理快报(英文版)

摘  要:Effects of dopant properties on microstructures and the electrical characteristics of poly (3-hexylthiophene) (P3HT) films are studied by doping 0.1 wt% 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F4?TCNQ), 6,6-phenyl-C61butyric acid methyl ester (PCBM) and N,N'?Diphenyl-N,N'-(m-tolyl)-benzidine (TPD) into P3HT, respectively. The introductions of various dopants in small quantities increase the field-effect mobility and the I on/Ioff ratio of P3HT thin-film transistors. However, each of dopants shows various effects on the crystalline order and the molecular orientation of P3HT films and the performance of P3HT thin-film transistors. These can be attributed to the various size, shape and energy-level properties of the dopants.Effects of dopant properties on microstructures and the electrical characteristics of poly (3-hexylthiophene) (P3HT) films are studied by doping 0.1 wt% 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F4?TCNQ), 6,6-phenyl-C61butyric acid methyl ester (PCBM) and N,N'?Diphenyl-N,N'-(m-tolyl)-benzidine (TPD) into P3HT, respectively. The introductions of various dopants in small quantities increase the field-effect mobility and the I on/Ioff ratio of P3HT thin-film transistors. However, each of dopants shows various effects on the crystalline order and the molecular orientation of P3HT films and the performance of P3HT thin-film transistors. These can be attributed to the various size, shape and energy-level properties of the dopants.

关 键 词:Soft matter liquids and polymers Electronics and devices Semiconductors Surfaces interfaces and thin films 

分 类 号:O484.42[理学—固体物理] TN321.5[理学—物理]

 

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