芒果的成熟与腐烂对介电特性的影响  

Effect on Dielectric Properties of Maturity and Decay of Mango

作　　者：廖宇兰[1] 翁绍捷[1] 张海德[2] 张燕[1] 王涛[1] 

机构地区：[1]海南大学机电工程学院,海南儋州571737 [2]海南大学食品学院,海南海口570228

出　　处：《农机化研究》2010年第11期174-177,184,共5页Journal of Agricultural Mechanization Research

基　　金：海南省自然科学基金项目(50888);华南热带农业大学科技基金项目(Rnd0626)

摘　　要：为了探索芒果的成熟与腐烂对介电特性的影响,利用介电特性无损检测的原理,设计了无损检测系统,测试了芒果存贮过程中的介电特性,包括串联等效电容、损耗因素、电感,并联等效电容、损耗因素、电感和阻抗。测试频率为100Hz,120Hz,1kHz,10kHz。结果表明,在芒果存贮的第6～8天(即芒果普遍开始腐烂时),等效电容达到最大值,损耗因素、等效电感、阻抗达到一个最低值;用100Hz频率来测试芒果的介电特性获得的综合测试效果好。Aim to explore the effect on dielectric properties of maturity and decay of mango.Based on dielectric properties of nondestructive determination principle,a nondestructive testing system was designed to test the dielectric properties of mango in the process of storage.The dielectric properties include capacitance,dissipation factor,inductance in the parallel equivalent circuit and series equivalent circuit,and impedance.Results showed that mango began to rot at the 6th storaging day to the 8th storaging day （post-harvest 6-8d）,and the value of capacitance was maximum;the values of dissipation factor,inductance,impedance were minimum.The best comprehensive test results can be measured at 100Hz.

关 键 词：芒果 存贮 成熟度 介电特性 

分 类 号：S126[农业科学—农业基础科学]