基于AVR单片机的新型光电整纬检测设备的研制  

Development of a new photoelectric weft-straightening system based on AVR microcontroller

作　　者：邓玉[1] 张冬梅[1] 

机构地区：[1]青岛理工大学通信与电子工程学院,山东青岛266033

出　　处：《天津工业大学学报》2010年第5期85-88,共4页Journal of Tiangong University

摘　　要：针对国内整纬装置的自动化程度亟待提高的现状,提出一种新型的基于AVR单片机的光电整纬检测设备.本设计选用ATmega128为CPU,应用光电检测原理,采用旋转式狭缝检测,在单片机内部实现AD转换,可对织物纬纱进行有效迅速的纬斜检测,检测精度可达0.25°.Due to the present situation of urgent need in the automation level of the domestic weft-straightening devices,a new photoelectric detection system for weft-straightening based on AVR microcontroller was developed.The design uses ATmega128 as the CPU,adopts photoelectric detection technology with rotary slot,and an AD transformation inside the MCU.This design can detect the distortion of the weft effectively and rapidly.The precision may amount to 0.25°.

关 键 词：光电整纬 检测 织物 狭缝 纬斜 

分 类 号：TS103.134[轻工技术与工程—纺织工程] TP274.5[轻工技术与工程—纺织科学与工程]