Bi_2Sr_2CaCu_2O_y单晶的变温(77～300K)X射线衍射研究  

TEMPERATURE DEPENENT(77～300K) STUDY ON Bi 2Sr 2CaCu 2O y SINGLE CRYSTAL BY X RAY DIFFRACTION

作　　者：胡林生[1,2] 孙学峰[1,2] 赵霞[1,2] 李晓光 

机构地区：[1]中国科学技术大学材料科学与工程系 [2]安庆师范学院物理系

出　　处：《低温物理学报》1999年第2期131-135,共5页Low Temperature Physical Letters

基　　金：国家自然科学基金

摘　　要：我们进行了Ｂｉ２Ｓｒ２ＣａＣｕ２Ｏｙ（Ｂｉ２２１２）单晶变温Ｘ射线衍射（ＸＲＤ）研究，定量给出温度从７７Ｋ变化至３００Ｋ时，ｃ轴晶格参数和００３８主峰的半高宽（ＦＷＨＭ）Δθ的变化．实验发现，从７７Ｋ至１４０Ｋ，晶格参数ｃ值变化是线性的，随温度较慢地单调增大；从１４０Ｋ附近至３００Ｋ，ｃ值的变化偏离了原来的线性，随温度较快地单调增大．另外，００３８主峰的半高宽Δθ随温度的变化在１４０Ｋ附近出现一个极大值．Abstract \ \ The temperature dependent study on Bi 2Sr 2CaCu 2O y (Bi2212) single crystal by x ray diffraction was carried out over the temperature range from 77K to 300K. Changes of c axis parameter, as well as the full width at half maximum(FWHM) of 00 38 main relfection (Δ θ ), with temperature were obtained. It was found that c deviates its original linearly with T in the temperature range 150～300K, that is , c increases more quickly with T . Additionally, the temperature dependence of Δ θ shows a maximum around T =140K. These results indicate an anomalous change in the structure of Bi2212 single crystal occurs at 140K.

关 键 词：BSCCO 单晶 超导体 变温X射线衍射 

分 类 号：TM262.01[一般工业技术—材料科学与工程] O511.1[电气工程—电工理论与新技术]