吡咯等离子体聚合膜及其注I^+层的复数折射率计算  

Extractions of Complex Refractive Indices for the Plasma - polymerized Pyrrole Film and its Implanted Surface Layer with 20 keV I+ Ions Beam

作　　者：浦天舒[1] 张铮扬[1] 吴美珍[1] 童志深[1] 

机构地区：[1]中国纺织大学基础科学部,上海200051

出　　处：《中国纺织大学学报》1999年第1期28-32,共5页Journal of China Textile University

基　　金：国家自然科学基金资助项目;批准号:19375036

摘　　要：以能量20keV、剂量1×10^(16)Ⅰ^(+)·cm^(-2)的Ⅰ^+离子束,辐照吡咯等离子体聚合膜,此表面注Ⅰ^(+)层的电导率可提高11个量级.从光的反射和透射谱(频率范围:紫外——可见光——近红外),应用传递矩阵方法,求得原始膜和注Ⅰ^+层的复数折射率,并在此光学研究的基础上,获取其能量损失函数的信息.The plasma - polymerized pyrrole film is irradiated by I+ ion beam of an energy of 2 0 keV at a fluence of 1 × 1016 cm'2 . The conductivity of the I+ implanted surface layer could be increased by 11 orders of magnitude. From the near - IR to UV reflectance and transmittance spectra, by using the transfer matrix method, we obtain the complex refractive indices of the pristine film and I+ implanted layer. On the basis of the optical studies, the information of the energy loss function is also available.

关 键 词：等离子体聚合 复数折射率 吡咯聚吡咯膜 膜 

分 类 号：O633.5[理学—高分子化学]