基于边界扫描的混合电路系统机内测试研究  

Research on BIT of Mixed-signal Circuits System Based on Boundary Scan

作　　者：陈圣俭[1] 王晋阳[1] 宋克岭 周浔[1] 徐磊[1] 

机构地区：[1]装甲兵工程学院控制工程系,北京100072 [2]北京969信箱55分箱,北京100072

出　　处：《计算机测量与控制》2010年第10期2213-2214,2218,共3页Computer Measurement &Control

基　　金：国家自然科学基金项目资助(60871029)

摘　　要：当今电子系统多由模数混合电路组成,随着电子技术的飞速发展,混合电路系统的集成度不断增加,其检测问题一直是测试领域的一个难点;针对混合电路系统的测试特点,以IEEE1149.4标准为研究基础,对某系统控制盒电路进行基于边界扫描的BIT(Builit-in Test机内测试)测试性设计和改造,并将改进后的被测系统进行测试性验证;实验结果表明,该电路系统通过74BCT8373与STA400边界扫描芯片的置换和置入,能够实现混合电路的互连测试与参数测试,且测量迅速,故障定位准确,可以有效提高电路系统的测试性。Most of the electronic systems contain the mixed-signal parts.With the rapid development of electronic technology and the increase of systems＇ integration,the corresponding test of mixed-signal circuits becomes one of the hardest topics.In view of the design characteristic of mixed-signal circuits system,based on the research of the IEEE Std1149.4,the Boundary-Scan BIT design and configuration of one system＇s control circuit are presented and validated.Experiment result indicates that the circuit system can make full use of 74BCT8373 and STA400 to realize the interconnect test and parametric test of mixed-signal circuit.This system which can make test rapidly and locate faults precisely,could promote the testability of electronic system efficaciously.

关 键 词：混合电路 边界扫描 BIT 故障检测 

分 类 号：TN707[电子电信—电路与系统]