基于冠层分析仪的冬小麦叶面积指数测算及模拟  

Variation regularity of winter-wheat leaf area index basing on plant canopy analyzer

作　　者：武海霞[1] 

机构地区：[1]河北工程大学水电学院,河北邯郸056021

出　　处：《河北工程大学学报（自然科学版）》2010年第3期104-106,共3页Journal of Hebei University of Engineering:Natural Science Edition

基　　金：河北工程大学校青年科学基金项目

摘　　要：为了精确模拟小麦群体生长发育过程,利用SUNSCAN冠层分析仪测定大田冬小麦叶面积指数,通过变换Logistic曲线修正方程拟合冬小麦返青至成熟期的叶面积指数,从而建立估算冬小麦叶面积指数的半经验公式。通过模拟值和实测值的比较,相关系数0.954 2,达到显著水平(p<0.05),表明该方法能有效测算、模拟局地作物叶面积指数的动态变化。The variation regularity of winter-wheat leaf area index is studied by use of the SUNSCAN plant canopy analyzer to simulate growth and development of winter-wheat in the field.According to the modification of Logistic curve,the semi-empirical formula for estimating leaf area index of winter-wheat is founded to fit the winter-wheat leaf area index from returning green stage to mature stage.The correlation coefficient is 0.954 2 between simulated value and measured value,which is up to positive level（p0.05）.The results show that the method mentioned above can well reflect the dynamic change of crop leaf area index.

关 键 词：冬小麦 叶面积指数 冠层分析仪 

分 类 号：S512.1[农业科学—作物学]