USB总线技术在大容量存储测试系统中的应用  

USB Bus Technology Application in High Capability Memory Test System

作　　者：崔亮飞[1] 

机构地区：[1]中北大学光电厂,山西太原030051

出　　处：《仪表技术》2010年第11期62-64,共3页Instrumentation Technology

摘　　要：文章针对大容量存储测试系统具体设计了USB接口电路,对应其1G的存储容量,采用了高速的通用可编程接口(GPIF)。围绕着GPIF和外围设备的通信做了硬件设计,重点讨论了外围设备的控制逻辑时序。The USB interface circuit is designed to solve high capability memory test system.It adopts the high rate General Programmable Interface（GPIF） because the FLASH has 1G memory capability.The design of hardware round the GPIF and peripheral equipments is carried out.Sequential control logic of peripheral equipments is mainly discussed.

关 键 词：通用串行总线 大容量存储测试 通用可编程接口 

分 类 号：TP39[自动化与计算机技术—计算机应用技术]