单片机传输系统EMP损伤效应研究  

The Study about EMP Damaged Effect of Single-chip System under EMP Environment

作　　者：翟爱斌[1] 崔志同[1] 吴宏志[2] 陈向跃[1] 聂鑫[1] 孙蓓云[1] 

机构地区：[1]西北核技术研究所,西安710024 [2]中国工程物理研究院应用电子学研究所,绵阳621900

出　　处：《核电子学与探测技术》2010年第9期1201-1206,共6页Nuclear Electronics & Detection Technology

摘　　要：搭建了一套小型单片机数据传输系统,研究了电流注入环境下系统的电磁脉冲(EMP)敏感单元、损伤阈值,结合具体的电路结构,对系统失效原因进行了分析。实验结果表明,MAX232芯片是系统的EMP敏感单元,不同批次的器件其EMP损伤阈值不同。研究结果可为系统级EMP损伤效应研究提供实验方法及数据参考。One small single-chip system for data transmission was built,the EMP susceptive cell and damaged threshold of this system were researched under current injection environment.The failure reason of EMP was analysed for the system.The results show that MAX232 chip is EMP susceptivity cell of the system,the damaged threshold of EMP of the different batches chips are different.The study can provide experiment method and data reference for EMP damage effect of system-level＇s electric equipment.

关 键 词：电流注入 单片机系统 EMP 损伤效应 

分 类 号：O441.5[理学—电磁学]