磁头内置DFH控制元件的过载荷可靠性分析和磁头温升实验设计  

DFH Control Components Built Head over the Reliability of Load and Head Temperature Experiment Design

作　　者：肖祥慧[1] 黎福海[1] 刘建平[1] 梁来朋[1,2] 

机构地区：[1]湖南大学电气与信息工程学院 [2]98756部队电子教研室

出　　处：《科技导报》2010年第21期30-33,共4页Science & Technology Review

基　　金：国家自然科学基金项目(60775047)

摘　　要：结合原子力显微镜(AFM)测试方法,从形变的性质和大小角度评估磁头内置动态飞行高度(DFH)控制元件,结果表明,即使在长时间过流的情况下,磁头内置DFH控制元件的突起仍属于弹性形变,未发生永久塑性形变;静止空气冷却条件下,磁头内置DFH控制元件的结构变形量与能量呈线性关系。采用脉冲式电场的破坏性测试方法,对磁头内置DFH控制元件进行过压击穿测试,测试结果表明,实际产品的击穿电压在安全区以外。论证了静止碟面加冷却膏法的可行性,进一步简化了磁头温升的实验过程。Combined with Aatomic Force Microscope （AFM） testing methods, from the size and property of the deformation to assess the head of the built-in Dynamic Flight Height （DFH） components. The results show that, even in a long time over-current circumstances, the processes of the built-in DFH components still belong to the nature of elastic deformation, no permanent plastic deformation occurs. In the still air cooling conditions, AFM results show that the relationship of the size of the distortion and energy about the head of the built-in DFH components is linear. Using the Destructive testing methods of pulsed electric field, the voltage breakdown test to the built-in DFH components was carried out, and the tests shows that the breakdown voltage of the actual product is outside the security zone. Meanwhile, the result demonstrates that the method of adding cooled paste to the static disc surface is possible. Thus it would further simplify the experimental process of the head temperature rise.

关 键 词：动态飞行高度 磁头 原子力显微镜 温升 

分 类 号：TH742[机械工程—光学工程]